Focused Ion Beamscanning Electron Microscope (Fibs...

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Country: Japan
Summary: Focused Ion Beamscanning Electron Microscope (Fibsem) System 1 Set
KWT Ref No: 119752943
Deadline: 16 Jul 2025
Competition: ICB
Financier: Self Financed
Purchaser Ownership: Public
Tender Value: Refer Document
Notice Type: Tender
Document Ref. No.:
Purchaser's Detail :

Purchaser : NATIONAL UNIVERSITY CORPORATION
Nakanishi Tatsuya, Procurement Section, Accounting Department, Administrative Division, Japan Advanced Institute Of Science And Technology, 1-1 Asahidai Nomi-Shi Ishikawa 923-1292 Japan, Tel 0761-51-1104

Description :
Focused Ion BeamScanning Electron Microscope (FIBSEM) system 1 Set
Documents :

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Focused Ion Beamscanning Electron Microscope (Fibsem) System 1 Set