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Tender Details
- Country: Spain
- Summary: Supply and Installation of an Electronic Scanning Microscope (Focused Ion Beam), X -Ray Analysis System and Mass Ablation System of Material by Clustered Laser, Destined ...
- KWT Ref No: 120686093
- Deadline: 14 Jul 2025
- Competition: ICB
- Financier: Self Financed
- Purchaser Ownership: Public
- Tender Value: 1700000
- Notice Type: Tender
- Document Ref. No.: 377443-2025
- Purchaser's Detail :
- Description :
- Supply and installation of an electronic scanning microscope (Focused Ion Beam), X -ray analysis system and mass ablation system of material by clustered laser, destined ...
As indicated in the justification memory of the technical specifications, in memory justification of the need to hire, and in the specifications of technical prescriptions.
Supply and installation of an electronic scanning microscope (Focused Ion Beam), X -ray analysis system and massive material ablation system by clusted laser, intended for the institute of Microelectronics of Seville of the State Agency Higher Council for Scientific Research.
Doc Title: Supply and installation of an electronic scanning microscope with FIB (Focused Ion Beam), X -ray analysis system and massive material ablation system by clusing laser, destined for the Institute of Microelectronics of Seville of the State Agency Higher Council for Scientific Research.
Contract Type: Supplies - Documents :
Purchaser : GENERAL SECRETARIAT OF THE STATE AGENCY HIGHER COUNCIL FOR SCIENTIFIC RESEARCH
Town: Madrid
NUTS-Code: ES300
Postal Code: 28006
ATTN: General Secretariat of the State Agency Higher Council for Scientific Research ...
Email :sgoi@csic.es
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