- Country: USA
- Summary: TECHNOLOGY LICENSING OPPORTUNITY: Intelligent, Rapid and Optimized Dimensional Inspection (IRODI)
- KWT Ref No: 119427383
- Deadline: 15 Jun 2025
- Competition: ICB
- Financier: Self Financed
- Purchaser Ownership: Public
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: S-191488
- Purchaser's Detail :
Purchaser : ENERGY, DEPARTMENT OF
505 King Ave, Columbus , OH 43201, USA
Primary Point of Contact: Mike Erickson, licensing@lanl.gov
Secondary Point of Contact: Lindsay Augustyn, licensing@lanl.gov
Email :licensing@lanl.gov
- Description :
- Description
IRODI-s Maestro software integrates with your existing metrology tools to perform surface dimensional inspections of machined components.
https://www.lanl.gov/engage/collaboration/feynman-center/tech-and-capability-search/irodi
The Challenge:
Manufacturers rely on precise dimensional inspections to meet engineering specifications; however, traditional methods are slow, create bottlenecks, and often rely on offsite measurements. The IRODI system is being developed to address these challenges by enabling real-time, in-process inspections on the production floor through the integration of optical scanning and the accuracy of coordinate measuring machines (CMMs).
How it Works:
A key component of IRODI, the Maestro software, has been tested in a lab setting using CMMs and laser scanners to perform dimensional inspections of machined components. Maestro integrates with existing metrology tools to coordinate inspections, analyze measurement data, and optimize quality control. A key attribute for MAESTRO is significantly reduced time for small batch inspection. The full IRODI system is designed to automate inspection planning, enable on-machine inspection across both subtractive and additive processes, identify defects earlier, reduce rework, support real-time decision-making, and integrate seamlessly with current manufacturing environments.
Key Advantages:
Improve inspection coverage and accuracy Adaptive algorithms identify critical measurement points Enables dimensional validation both during manufacturing and the design phaseProblems Solved:
Identifies defects early to reduce waste Matches parts for optimal fit based on tolerance Aligns hardware and quality control processesMarket Applications:
Advanced Manufacturing Aerospace and Defense Automotive Medical Devices Nuclear and Energy SemiconductorsDevelopment Status: TRL 5
US Provisional Patent Application No., Docket No.: Patent pending, S-191488: Method and Syst...
- Documents :
Tender Notice
IRODI_LA_UR_25_23024-2.pdf
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