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Tender Details
- Country: USA
- Summary: Technology Transfer Opportunity: Electric Field Imaging System (Lar-Tops-116)
- KWT Ref No: 100412954
- Deadline: 23 Apr 2025
- Competition: ICB
- Financier: Self Financed
- Purchaser Ownership: Public
- Tender Value: Refer Document
- Notice Type: Tender
- Document Ref. No.: T2P-LaRC-00146
- Purchaser's Detail :
- Description :
- Description
NASA-s Technology Transfer Program solicits inquiries from companies interested in obtaining license rights to commercialize, manufacture and market the following technology. License rights may be issued on an exclusive or nonexclusive basis and may include specific fields of use. NASA provides no funding in conjunction with these potential licenses.
THE TECHNOLOGY:
NASA Langley Research Center's Electric Field Imaging (EFI) system is the only noncontact method capable of quantitatively measuring the magnitude and direction of electrostatic fields in near- and far-field applications. Based on low-cost, commercially available components, the EFI system uses measurement of very low-current, human-safe electric fields to construct a three-dimensional image of objects and people based on their dielectric properties. This platform technology, originally developed for measurement of the efficacy of electrical shielding around cables, could be optimized for a variety of applications, including medical imaging, security and detection, weather and natural disaster prediction, and nondestructive evaluation of composites and insulators. The EFI system has the potential to offer a lower-cost, portable, and safer alternative to the imaging systems currently used in these applications.
The EFI imaging platform consists of a sensor array, processing equipment, and an output device. By registering voltage differences at multiple points within the sensor array, the EFI system can calculate the electrical potential at points removed from the sensor. Using techniques similar to computed tomography, the electrical potential data can be assembled into a three-dimension map of the magnitude and direction of electric fields. Since objects interact with electric fields differently based on their shape and dielectric properties, this electric field data can then be used to understand shape, internal structure, and dielectric properties (e.g., impedance, resistanc... - Documents :
Purchaser : NATIONAL AERONAUTICS AND SPACE ADMINISTRATION
Contracting Office Address : HAMPTON , VA 23681
Primary Point of Contact : NASA-s Technology Transfer Program
Agency-Patent-Licensing@mail.nasa.gov
Email :agency-patent-licensing@mail.nasa.gov
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